Publications of VALIEV IPT RAS, YB members for 2021 year

  1. Rudy A.S., Kulikov A.N., Bachurin V.I. Surface erosion by moving ion beam. Vacuum, Volume 193, 2021, 110504. DOI: 10.1016/j.vacuum.2021.110504
  2. Popov V.P., Tikhonenko F.V., Antonov V.A.,Tarkov S.M., Gutakovskii A.K., Vdovin V.I., Simakin S.G., Rudenko K.V. Blister suppression in the CO+ molecule implanted SOI substrates with ultrathin buried oxides. Mater. Today Commun. (2021), v.28, p.102498. DOI: 10.1016/j.mtcomm.2021.102498
  3. Uvarov I.V. Migration of adhesive material in electrostatically actuated MEMS switch // Microelectronics Reliability. – 2021. – Vol. 125. – 114372. DOI: 10.1016/j.microrel.2021.114372
  4. Popov V.P., Tarkov S.M., Tikhonenko F.V., Antonov V.A., Tyschenko I.E., Simakin S.G., Rudenko K.V. Thermally Robust High-Resistance Layers on Low-Resistance Silicon Synthesized by Molecular CO+ Ion Implantation. Physica Status Solidi. A: Applications and Materials Science. 2021. DOI: 10.1002/pssa.202100109
  5. Muravyeva T.I., Uvarov I.V., Naumov V.V., Palasantzas G., Svetovoy V.B. Excessive number of high asperities for sputtered rough films. Phys. Rev. B 104, 035415 (2021), DOI: 10.1103/PhysRevB.104.035415
  6. Kulova, T., Mironenko, A., Rudy, A., Skundin, A. (2021). All Solid State Thin-Film Lithium-Ion Batteries: Materials, Technology, and Diagnostics (1st ed.). CRC Press. DOI: 10.1201/9780429023736
  7. Uvarov I.V., Shlepakov P.S., Postnikov A.V., Svetovoy V.B. Highly energetic impact of H2 and O2 nanobubbles on Pt surface. Journal of Colloid and Interface Science, 2021, Vol. 582, P. 167-176. DOI: 10.1016/j.jcis.2020.07.135.
  8. Amirov I.I., Izyumov M.O., Naumov V.V., Gorlachev E.S. Ion-plasma sputtering of Co and Mo nanometer thin films near the sputtering threshold. Journal of Physics D: Applied Physics 54 (2021) 065204. DOI: 10.1088/1361-6463/abc3ed.
  9. Sergey P. Zimin, Ildar I. Amirov, Sergey V. Vasilev, Ivan S. Fedorov, Leonid A. Mazaletskiy, Nam-Hoon Kim. Modification of Nanocrystalline Porous Cu2-xSe Films during Argon Plasma Treatment // Appl. Sci. 2021, 11, 612. DOI: doi.org/10.3390/app11020612
  10. Uvarov I.V., Shlepakov P.S., Melenev A.E., Ma K., Svetovoy V.B., Krijnen G.J.M. A peristaltic micropump based on the fast electrochemical actuator: Design, fabrication, and preliminary testing. Actuators, 2021, Vol. 10, 62. DOI: 10.3390/act10030062
  11. Alexander Rogozhin, Andrey Miakonkikh, Elizaveta Smirnova, Andrey Lomov, Sergey Simakin and Konstantin Rudenko. Plasma Enhanced Atomic Layer Deposition of Ruthenium Films Using Ru(EtCp)2 Precursor. Coatings 2021, 11(2), 117. DOI: 10.3390/coatings11020117
  12. Popov V.P., Tikhonenko F.V., Antonov V.A., Tyschenko I.E., Miakonkikh A.V., Simakin S.G., Rudenko K.V. Diode-Like Current Leakage and Ferroelectric Switching in Silicon SIS Structures with Hafnia-Alumina Nanolaminates. Nanomaterials 2021, 11(2), 291. 10.3390/nano11020291
  13. Akulov A.A., Trushin O.S., Popov A.A., Pestova A.N., Mazaletsky L.A., Lomov A.A. Nanostructuring at oblique incidence deposition of cobalt. Journal of Physics: Conference Series. 2021. 2086 012001. DOI: 10.1088/1742-6596/2086/1/012001
  14. Grushevski E., Savelev D., Mazaletski L., Savinski N., Puhov D. The scalable production of high-quality nanographite by organic radical-assisted electrochemical exfoliation. Journal of Physics: Conference Series. 2021. 2086 012014. DOI: 10.1088/1742-6596/2086/1/012014
  15. Pestova A.N., Trushin O.S. Four-point probe stand for magnetoresistance measurement of unpatterned sample. Journal of Physics: Conference Series. 2021. 2086 012062. DOI: 10.1088/1742-6596/2086/1/012062
  16. Savelev D., Grushevski E., Savinski N., Soloviev M., Turov V., Krenev V. The electromagnetic absorbers based nano - structured granular polymer-composites at gigahertz frequencies. Journal of Physics: Conference Series. 2021. 2086 012064. DOI: 10.1088/1742-6596/2086/1/012064
  17. Shlepakov P.S., Uvarov I.V. Design and simulation of the compact MEMS energy harvester based on aluminium nitride. Journal of Physics: Conference Series, 2021, Vol. 2086, 012066. DOI: 10.1088/1742-6596/2086/1/012066
  18. Uvarov I.V., Marukhin N.V. A seesaw-type MEMS switch with enhanced contact force: the first results. Journal of Physics: Conference Series, 2021, Vol. 2086, 012069. DOI: 10.1088/1742-6596/2086/1/012069
  19. Smirnova M.A., Ivanov A.S., Bachurin V.I. and Churilov A.B. Study of ripple formation on Si surface under Ga ion beam bombardment. Journal of Physics: Conference Series 2086 (2021) 012210 DOI: 10.1088/1742-6596/2086/1/012210
  20. Postnikov A.V. Dual scanning interferometric technique for measurements of the temperature and concentration dependence of the refractive index of liquids. Measurement Science and Technology (2020) Volume 32, Number 1, 015907. DOI: 10.1088/1361-6501/abb5da
  21. Amirov I.I., Selyukov R.V., Naumov V.V., Gorlachev E.S. Influence of Deposition Conditions and Ion-Plasma Treatment of Thin Cobalt Films on Their Electrical Resistivity. Russian Microelectronics, volume 50, pages 1–7 (2021). DOI: 10.1134/S1063739721010030
  22. Kulova T.L., Mazaletskii L.A., Mironenko A.A., Rudyi A.S., Skundin A.M., Tortseva Yu.S., Fedorov I.S. Experimental Study of the Influence of the Porosity of Thin-Film Silicon-Based Anodes on Their Charge-Discharge Characteristics. Russian Microelectronics, volume 50, pages 45–53 (2021). DOI: 10.1134/S1063739720060074
  23. Trushin O.S., Barabanova N.I. Domain Wall Precession in a Narrow Magnetic Nanowire. Russian Microelectronics, volume 50, pages 69–73 (2021). DOI: 10.1134/S1063739721010091
  24. Mordvintsev V.M., Gorlachev E.S., Kudryavtsev S.E. Effect of the Electroformation Conditions on the Switching Stability of Memristors Based on Open “Sandwich” Structures in an Oxygen Medium. Russian Microelectronics, volume 50, pages 146–154 (2021). DOI: 10.1134/S1063739721020062
  25. Rudy A.S., Morozov O.V., Kurbatov S.V. A Modernized Bosch Etching Process for the Formation of Tapered Structures on a Silicon Surface. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 15, pages 461–466 (2021). DOI: 10.1134/S1027451021030162

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