Publications of YB IPT RAS members for 2020 year

  1. Hao Zhang, Kochubei S.A., Popov A.A., Volodin V.A. On Raman scattering cross section ratio of amorphous to nanocrystalline germanium. Solid State Communications, v. 313 (2020), 113897.
  2. Svetovoy V.B., Prokaznikov A.V., Postnikov A.V., Uvarov I.V., Palasantzas G. Explosion of Microbubbles Generated by the Alternating Polarity Water Electrolysis. Energies, 2020, 13(1), 20.
  3. Uvarov I.V., Selyukov R.V., Naumov V.V. Testing of aluminium and its alloys as structural materials for a MEMS switch. Microsystem Technologies, 2020, DOI 10.1007/s00542-020-04748-2.
  4. Prigara, V. , Kupriyanov, A. and Ovcharov, V. (2020) The Effect of Quartz Window on Bistability of the Silicon Wafer in Lamp-Based Reactor. Journal of Materials Science and Chemical Engineering, 8, 54-65. doi: 10.4236/msce.2020.81006.
  5. Savinskii N.G., Melesov N.S., Parshin E.O., Vasiliev S.V., Bachurin V.I., Churilov A.B. Analyzing Products of the Electrochemical Exfoliation of Graphite via Rutherford Backscattering and X-Ray Diffractometry. Bulletin of the Russian Academy of Sciences: Physics, 2020, Vol. 84, No. 6, pp. 732–735.
  6. Svetovoy V.B., Postnikov A.V., Uvarov I.V., Stepanov F.I., Palasantzas G. Measuring the dispersion forces near the van der Waals–Casimir transition. Physical Review Applied, 2020, Vol. 13, 064057. DOI: 10.1103/PhysRevApplied.13.064057.
  7. Rasool S., Saritha K., Reddy K.T.R., Tivanov M.S., Gremenok V.F., Zimin S.P., Pipkova A.S., Mazaletskiy L.A., Amirov I.I. Annealing and plasma treatment effect on structural, morphological and topographical properties of evaporated β-In2S3 films. Materials Research Express. 2020. Т. 7. № 1. С. 016431.
  8. Makoviichuk M.I. Flicker-noise processes in structurally-disordered silicon systems. // Annali d`Italia. - 2020. - № 10, part 1. - P. 26 – 39.
  9. Uvarov I.V., Melenev A.E., Selyukov R.V., Svetovoy V.B. Improving the performance of the fast electrochemical actuator. Sensors and Actuators A: Physical, 2020, Vol. 315, 112346. DOI: https://doi.org/10.1016/j.sna.2020.112346
  10. Uvarov I.V., Marukhin N.V., Shlepakov P.S., Lukichev V.F. Calculation of Performance of MEMS-Switch with Increased Capacitance Ratio. Russian Microelectronics, volume 49, pages 253–262 (2020). DOI: https://doi.org/10.1134/S1063739720040113
  11. Mordvintsev V.M., Gorlachev E.S., Kudryavtsev S.E., Levin V.L. Influence of Oxygen Pressure on Switching in Memoristors Based on Electromoformed Open Sandwich Structures. Russian Microelectronics, volume 49, pages 269–277 (2020). DOI: https://doi.org/10.1134/S1063739720040058
  12. Rudyi A.S., Lebedev M.E., Mironenko A.A., Mazaletskii L.A., Naumov V.V., Novozhilova A.V., Fedorov I. S.,  Churilov A.B. Study of the Relaxational Polarization Dynamics of the LiPON Solid Electrolyte. Russian Microelectronics, volume 49, pages 345–357 (2020). DOI: https://doi.org/10.1134/S1063739720040095
  13. Prokaznikov A.V., Paporkov V.A. Study of the Magneto-Optical Properties of Structures on Curved Surfaces for Creating Memory Elements on Magnetic Vortices. Russian Microelectronics, volume 49, pages 358–371 (2020). DOI: https://doi.org/10.1134/S1063739720040071
  14. Rudyi A.S., Mironenko A.A., Naumov V.V., Skundin A.M., Kulova T.L., Fedorov I.S., Vasil’ev S.V. A Solid-State Lithium-Ion Battery: Structure, Technology, and Characteristics. Technical Physics Letters, volume 46, pages 215–219 (2020). DOI: https://doi.org/10.1134/S1063785020030141
  15. Lomov A.A., Seredin B.M., Martyushov S.Yu., Zaichenko A.N., Simakin S.G., Shul’pina I.L. Structural Perfection and Composition of Gallium-Doped Thermomigration Silicon Layers. Technical Physics Letters, volume 46, pages 279–282 (2020). DOI: https://doi.org/10.1134/S1063785020030268
  16. Kolchin A.V., Shuleiko D.V., Pavlikov A.V., Zabotnov S.V., Golovan L.A., Presnov D.E., Volodin V.A., Krivyakin G.K., Popov A.A., Kashkarov P.K. Femtosecond Laser Annealing of Multilayer Thin-Film Structures Based on Amorphous Germanium and Silicon. Technical Physics Letters, volume 46, pages 560–563 (2020). DOI: https://doi.org/10.1134/S1063785020060048
  17. Bachurin V.I., Zhuravlev I.V., Pukhov D.E., Rudy A.S., Simakin S.G., Smirnova M.A., Churilov A.B. Angular Dependences of Silicon Sputtering by Gallium Focused Ion Beam. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 14, pages 784–790 (2020). DOI: https://doi.org/10.1134/S1027451020040229
  18. Selyukov R.V., Izyumov M.O., Naumov V.V. The Influence of Low-Energy Ion-Plasma Treatment on the Surface Morphology of Pt Films with Varying Strength of Crystalline Texture. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 14, pages 777–783 (2020). DOI: https://doi.org/10.1134/S1027451020040321
  19. Shumilov A.S., Amirov I.I. Profile Evolution of Silicon Nanostructures in Argon-Plasma Sputtering. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 14, pages 935–943 (2020). DOI: https://doi.org/10.1134/S1027451020050195
  20. Pukhov D.E., Lapteva A.A. Taking into Account the Surface Roughness in the Electron-Probe Energy-Dispersive Analysis of Powder Materials. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 14, pages 889–898 (2020). DOI: https://doi.org/10.1134/S1027451020050146
  21. Selyukov R.V., Naumov V.V. The Influence of Film Thickness on the Annealing-Induced Changes of Texture and of the Fraction of Crystalline Phase in Pt Films. Technical Physics, volume 65, pages 762–770 (2020). DOI: https://doi.org/10.1134/S1063784220050229
  22. Savinsky N.G., Melesov N.S., Parshin E.O., Vasiliev S.V., Bachurin V. I., Churilov A.B. Analyzing Products of the Electrochemical Exfoliation of Graphite via Rutherford Backscattering Spectrometry and X-Ray Diffractometry. Bulletin of the Russian Academy of Sciences: Physics, volume 84, pages 732–735 (2020). DOI: https://doi.org/10.3103/S1062873820060222
  23. Postnikov A.V. Collapse Dynamics of Hemispherical Cavitation Bubble in Contact with a Solid Boundary. Fluid Dynamics, volume 55, pages 454–464 (2020). DOI: https://doi.org/10.1134/S0015462820040096
  24. Krivyakin G.K., Volodin V.A., Kamaev G.N., Popov A.A. Effect of Interfaces and Thickness on the Crystallization Kinetics of Amorphous Germanium Films. Semiconductors, volume 54, pages 754–758 (2020). DOI: https://doi.org/10.1134/S1063782620070040
  25. Belevtsev A.M., Epaneshnikova I.K., Kruchkov V.L., Dryagin I.O., Lukichev V.F., Uvarov I.V., Boldyreff A.S. Research of the influence of technological parameters on the electrophysical characteristics of the RF MEMS switch. Proceedings of SPIE, 2020, Vol. 11541 (Millimetre Wave and Terahertz Sensors and Technology XIII), 115410M. DOI: 10.1117/12.2582078
  26. Shlepakov P.S., Uvarov I.V., Naumov V.V., Svetovoy V.B. Choosing the electrode material for the fast electrochemical actuator. Journal of Physics: Conference Series, 2020, Vol. 1695, 012155. DOI: 10.1088/1742-6596/1695/1/012155
  27. Marukhin N.V., Uvarov I.V. An improved design of a seesaw-type MEMS switch for increased contact force. Journal of Physics: Conference Series, 2020, Vol. 1695, 012157. DOI: 10.1088/1742-6596/1695/1/012157
  28. Babushkin A.S. The effect of low-energy ion bombardment on residual stress in thin metal films due to the generation of surface defects and their migration to the grain boundary. Journal of Physics: Conference Series. 2020. Vol. 1695, 012194. DOI:10.1088/1742-6596/1695/1/012194

Laboratories

Contacts

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