Publications of YB IPT RAS members for 2019 year

  1. Buchin E.Yu., Mironenko A.A., Naumov V.V., Rudyi A.S., Fedorov I.S. Structural Changes in Si–CuSi Films upon Intercalation of Lithium Ions. Technical Physics Letters, volume 45, pages 973-976 (2019)
  2. Bachurin V.I., Melesov N.S., Parshin E.O., Rudy A.S., Churilov A.B. Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry. Technical Physics Letters, volume 45, pages 609–612 (2019)
  3. Volodin V.A., Krivyakin G.K., Ivlev G.D., Prokopyev S.L., Gusakova S.V., Popov A.A. Crystallization of Amorphous Germanium Films and Multilayer a-Ge/a-Si Structures upon Exposure to Nanosecond Laser Radiation. Semiconductors, volume 53, pages 400–405 (2019)
  4. Bachurin V.I., Melesov N.S., Mironenko A.A., Parshin E.O., Rudy A.S., Simakin S.G., Churilov A.B. Depth Profiling of Layered Si?O?Al Thin Films with Secondary Ion Mass Spectrometry and Rutherford Backscattering Spectrometry. Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, volume 13, pages 300–305 (2019)
  5. Buchin E.Yu., Naumov V.V., Vasilyev S.V. Formation of Nanoporous Copper-Silicide Films. Semiconductors, volume 53, pages 395-399 (2019)
  6. Paporkov V.A., Prokaznikov A.V. Magnetooptical Response of Metallized Nanostructural Arrays with a Complex Relief on the Surface of Silicon Wafers. Russian Microelectronics, volume 48, pages 43–58 (2019)
  7. Sobolev N.A., Aleksandrov O.V., Sakharov V.I., Serenkov I.T., Shek E.I., Kalyadin A.E., Parshin E.O., Melesov N.S. Influence of Annealing Temperature on Electrically Active Centers in Silicon Implanted with Germanium Ions. Semiconductors, volume 53, pages 153–155 (2019)
  8. Sobolev N.A., Kalyadin A.E., Sakharov V.I., Serenkov I.T., Shek E.I., Parshin E.O., Melesov N.S., Simakin C.G. Dislocation-Related Photoluminescence in Silicon Implanted with Germanium Ions. Semiconductors, volume 53, pages 156–159 (2019)
  9. Uvarov I.V., Marukhin N.V., Naumov V.V. Contact resistance and lifecycle of a single- and multiple-contact MEMS switch. Microsyst Technol (2019). https://doi.org/10.1007/s00542-018-4279-2
  10. Gorlachev E.S., Mordvintsev V.M., Kudryavtsev S.E. Proc. SPIE 11022, Investigations of the resistive switching of the TiN-TiO2-SiO2-W memristors in the oxygen atmosphere with varying pressure, 110220D (15 March 2019). https://doi.org/10.1117/12.2520434
  11. Uvarov I.V., Kupriyanov A.N. Proc. SPIE 11022, A low actuation voltage MEMS switch with protection against stiction, 110220P (15 March 2019) https://doi.org/10.1117/12.2520838
  12. Morozov O.V., Uvarov I.V. Proc. SPIE 11022, Determination of vibration axes of the micromachined ring resonator for the modal tuning purposes, 110220W (15 March 2019) https://doi.org/10.1117/12.2521123
  13. Popov A.A., Berdnikov A.E. Proc. SPIE 11022, Influence of power and pulsed regime of low frequency discharge on clusters incorporation in dielectric films for ReRAM application, 1102218 (15 March 2019) https://doi.org/10.1117/12.2521784
  14. Bachurin V., Churilov A., Melesov N., Parshin E., Rudy A., Trushin O. Proc. SPIE 11022, The opportunities of Rutherford backscattering spectroscopy for analysis of multilayer nanometer thin film structures, 110221I (15 March 2019) https://doi.org/10.1117/12.2522103
  15. Prokaznikov A.V., Paporkov V.A., Zvezdin N.Yu. Proc. SPIE 11022, Different magnetooptical properties of metallized nanostructured arrays on silicon surface, 110221K (15 March 2019) https://doi.org/10.1117/12.2520304
  16. Trushin O.S., Granato E., Ying S.C. Proc. SPIE 11022, Energetics of domain wall in magnetic nanowire, 110221L (15 March 2019) https://doi.org/10.1117/12.2521401
  17. Denisenko Yu.I. Proc. SPIE 11022, Synergistic effects of deformation and solid-state reactions in Si with buried glass layer initiated by annealing in non-isothermal reactor, 110221T (15 March 2019) https://doi.org/10.1117/12.2521443
  18. Prigara V.P., Ovcharov V.V. Proc. SPIE 11022, Induced bistability into quartz glass by silicon wafer heat treatment in lamp-based reactor, 110221U (15 March 2019) https://doi.org/10.1117/12.2521891
  19. Ovcharov V.V., Prigara V.P., Kurenja A.L., Rudakov V.I. Proc. SPIE 11022, Localization of a thermo-optical traveling wave at an optical inhomogeneity in a silicon wafer under lamp-based heating, 110221V (15 March 2019) https://doi.org/10.1117/12.2521465
  20. Amirov I.I., Gorlachev E.S., Mazaletsky L.A., Izyumov M.O. Proc. SPIE 11022, Formation of metallic nanowire and nanonet structures on the surface of SiO2 by combine plasma etching processes, 1102221 (15 March 2019) https://doi.org/10.1117/12.2521275
  21. Babushkin A., Selyukov R., Amirov I. Proc. SPIE 11022, Effect of Ar ion-plasma treatment on residual stress in thin Cr films, 1102223 (15 March 2019) https://doi.org/10.1117/12.2521617
  22. Shlepakov P.S., Uvarov I.V., Naumov V.V., Mazaletskiy L.A., Svetovoy V.B. Degradation of titanium electrodes in the alternating polarity electrolysis. International Journal of Electrochemical Science, 2019, Vol. 14, P. 5211-5225. https://doi.org/10.20964/2019.06.62
  23. Uvarov I.V., Melenev A.E., Lokhanin M.V., Naumov V.V., Svetovoy V.B. A fast electrochemical actuator in the non-explosive regime. Journal of Micromechanics and Microengineering, 2019, Vol. 29, 114001. https://doi.org/10.1088/1361-6439/ab3bde
  24. Uvarov I.V., Kupriyanov A.N. Reliability of platinum contacts in a cold operated MEMS switch. Journal of Physics: Conference Series, 2019, Vol. 1319, 012001. https://doi.org/10.1088/1742-6596/1319/1/012001
  25. Trushin O.S., Barabanova N.I. Energetics of domain wall in magnetic nanowire. Journal of Physics: Conference Series, 2019, Vol. 1389, 012001. https://doi.org/10.1088/1742-6596/1389/1/012003
  26. Zhigunov D.M., Popov A.A., Chesnokov Yu.M., Vasiliev A.L., Lebedev A.M., Subbotin I.A., Yakunin S.N., Shalygina O.A., Kamenskikh I.A. Near-IR Emitting Si Nanocrystals Fabricated by Thermal Annealing of SiNx/Si3N4 Multilayers. Appl. Sci. 2019. 9(22), 4725. https://doi.org/10.3390/app9224725
  27. Mironenko A.A., Fedorov I.S., Rudy A.S., Andreev V.N., Gryzlov D.Yu., Kulova T.L., Skundin A.M. Charge–discharge performances of the Si–O–Al electrodes. Monatshefte für Chemie, 2019, Volume 150, Issue 10, pp 1753–1759.
  28. Shlepakov P.S., Uvarov I.V., Naumov V.V., Melenev A.E., Svetovoy V.B. Optimization of electrodes for the fast electrochemical actuator. Journal of Physics: Conference Series, 2019, Vol. 1410, 012197. https://doi.org/10.1088/1742-6596/1410/1/012197
  29. Uvarov I.V., Marukhin N.V. Contact resistance and lifecycle of an ohmic MEMS switch with single and multiple contact bumps. Journal of Physics: Conference Series, 2019, Vol. 1410, 012205. https://doi.org/10.1088/1742-6596/1410/1/012205
  30. Zimin S.P., Mazaletsiy L.A., Amirov I.I., Gorlachev E.S., Gremenok V.F., Khoroshko V.V. Nanostructuring of the CIGS films surface by the plasma treatment with low ion energy. International J. Nanoscience. 2019. V. 18.N.3&4. P. 1940064. DOI:10.1142/ S0219581X19400647
  31. Zimin S.P., Pipkova A.S., Mazaletsiy L.A., Amirov I.I., Gorlachev E.S., Vasilev S.V., Gremenok V.F., Khoroshko V.V., Pyatlitski A.N. Formation of metallic droplets on the surface of indium sulfide films during argon plasma treatment. International J. Nanoscience. 2019. V. 18.N.3&4. P. 1940066. DOI:10.1142/ S0219581X19400660.
  32. Zimin S.P., Mokrov D.A., Amirov I.I., Naumov V.V., Gorlachev E.S., Gremenok V.F., Khoroshko V.V. Impact of plasma nanostructuring on the electrical properties of Cu(In,Ga)Se2 films. Journal of Physics: Conference Series, 2019, Volume 1238, Number 1, 012040 (Citation: S P Zimin et al 2019 J. Phys.: Conf. Ser. 1238 012040)
  33. Zimin S.P., Gorlachev E.S., Amirov I.I., Naumov V.V., Juskenas R., Skapas M., Abramof E., Rappl P.H.O. Plasma-assisted surface nanostructuring of epitaxial Pb1−xSnxTe (0≤x≤1) films. 2019 Semicond. Sci. Technol. 34 095001

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